Home > Quality > Quality-Destructive Testing
Request Quote
English
  • Decapsulation

    Exposes die structure, verifies chip size, manufacturer logos, and part numbers.

  • Heated Solvent Testing

    Identifies counterfeiting signs like sand marks, texture inconsistencies, and blacktopping.

  • Solderability & BGA Reflow Testing

    Confirms lead coating durability and assesses oxidation/corrosion levels.

  • Parallel Lap

    Gradually removes material layers through precision grinding and polishing to expose internal structures for defect analysis.

  • Hot Spot Test

    Uses infrared imaging to detect localized overheating, identifying potential failure points in electronic components.

  • Bond Pull & Die Shear Testing

    Measures bond strength and material integrity for compliance with reliability standards.

  • Cross-Section Analysis

    Examines internal component structure to identify defects that could lead to failures.

  • Thermal Cycle

    Repeatedly exposes components to alternating high and low temperatures to assess reliability under thermal expansion and contraction.

  • Thermal Shock

    Subjects components to sudden and extreme temperature changes to evaluate resistance to rapid thermal transitions.

  • Burn-in

    Operates components under elevated temperature and electrical stress for an extended period to detect early-life failures.

  • Drop Test

    Simulates mechanical shock by dropping components from a specified height to assess durability and structural integrity.

  • Vibration Test

    Applies controlled vibrations to components to evaluate resistance to mechanical fatigue and transportation stress.

  • Environmental Exposure (Temperature And Humidity)

    Tests component performance under extreme temperature and humidity conditions to ensure long-term reliability.

  • Salt Spray Test

    Exposes components to a salt mist environment to assess corrosion resistance, particularly for metal parts and coatings.

  • Electrical Overstress Testing

    Applies excessive electrical stress to determine a component’s failure thresholds and safety margins.

  • Mechanical Stress Testing

    Evaluates component resilience by applying physical forces such as bending, compression, or torsion to simulate real-world stresses.

Contact Us

FUTURETECH COMPONENTS PTE LTD (Singapore)
Address:3 Coleman Street #04-35 Peninsula Shopping Complex, Singapore 179804
+65-94871798

FUTURETECH COMPONENTS LTD (Vietnam)
Address:11th Floor,Viet A Building,No.9 Duy Tan Street,Cau Giay District,Hanoi,Vietnam
+84-345873200

FUTURETECH COMPONENTS LTD (Hong Kong)
Address:Unit D12 On 16th Floor, Jing Ho Industrial Building, Nos.78-84 Wang Lung Street, Tsuen Wan, New Territories, Hongkong China
+852-69495643

FUTURETECH COMPONENTS LTD (Shenzhen)
Address: 9A HIVAC Technology Building, No.2 South 8th Road of Science and Technology, Yuehai Street, Nanshan District, Shenzhen, China
+86-0755-82814007


Select Language

Click on the space to exit